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A total standard WIP estimation method for wafer fabrication

Identifieur interne : 000B75 ( Main/Exploration ); précédent : 000B74; suivant : 000B76

A total standard WIP estimation method for wafer fabrication

Auteurs : Yu-Hsin Lin [Niger, République populaire de Chine] ; Ching-En Lee [République populaire de Chine]

Source :

RBID : ISTEX:D7B62F29398F2D82880ADE4875EFC1203BBF41BF

Abstract

The standard work-in-process (WIP) level in a wafer fabrication factory is an important parameter which can be properly used to trigger the decision of when to release specific wafer lots. There are many WIP-based release control policies which have been proven to be effective for wafer fabrication manufacturing, few methods have been proposed to find the suitable WIP-level as a parameter for these release policies. This paper proposes a queueing network-based algorithm to determine the total standard WIP level so that the Fixed-WIP release algorithm to determine the total standard WIP level so that the Fixed-WIP release control policy can apply. A numerical example is provided to elaborate the algorithm. A simulation model of a real-world wafer fabrication factory in Taiwan is built and analyzed. Results of simulation experiment indicate that under the Fixed-WIP control policy, the total standard WIP level estimated from this study achieves a target throughput rate while keeping the corresponding cycle time relatively low. Results also demonstrate that the queueing network-based algorithm is a very useful method to determine the standard WIP level efficiently.

Url:
DOI: 10.1016/S0377-2217(99)00446-4


Affiliations:


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Le document en format XML

<record>
<TEI wicri:istexFullTextTei="biblStruct">
<teiHeader>
<fileDesc>
<titleStmt>
<title>A total standard WIP estimation method for wafer fabrication</title>
<author>
<name sortKey="Lin, Yu Hsin" sort="Lin, Yu Hsin" uniqKey="Lin Y" first="Yu-Hsin" last="Lin">Yu-Hsin Lin</name>
</author>
<author>
<name sortKey="Lee, Ching En" sort="Lee, Ching En" uniqKey="Lee C" first="Ching-En" last="Lee">Ching-En Lee</name>
</author>
</titleStmt>
<publicationStmt>
<idno type="wicri:source">ISTEX</idno>
<idno type="RBID">ISTEX:D7B62F29398F2D82880ADE4875EFC1203BBF41BF</idno>
<date when="2001" year="2001">2001</date>
<idno type="doi">10.1016/S0377-2217(99)00446-4</idno>
<idno type="url">https://api.istex.fr/document/D7B62F29398F2D82880ADE4875EFC1203BBF41BF/fulltext/pdf</idno>
<idno type="wicri:Area/Istex/Corpus">001987</idno>
<idno type="wicri:Area/Istex/Curation">001987</idno>
<idno type="wicri:Area/Istex/Checkpoint">000757</idno>
<idno type="wicri:explorRef" wicri:stream="Istex" wicri:step="Checkpoint">000757</idno>
<idno type="wicri:doubleKey">0377-2217:2001:Lin Y:a:total:standard</idno>
<idno type="wicri:Area/Main/Merge">000C17</idno>
<idno type="wicri:Area/Main/Curation">000B75</idno>
<idno type="wicri:Area/Main/Exploration">000B75</idno>
</publicationStmt>
<sourceDesc>
<biblStruct>
<analytic>
<title level="a">A total standard WIP estimation method for wafer fabrication</title>
<author>
<name sortKey="Lin, Yu Hsin" sort="Lin, Yu Hsin" uniqKey="Lin Y" first="Yu-Hsin" last="Lin">Yu-Hsin Lin</name>
<affiliation wicri:level="1">
<country wicri:rule="url">Niger</country>
</affiliation>
<affiliation wicri:level="1">
<country xml:lang="fr" wicri:curation="lc">République populaire de Chine</country>
<wicri:regionArea>Department of Industrial Engineering and Management, Ta Hwa Institute of Technology, Hsin Chu, Taiwan</wicri:regionArea>
<wicri:noRegion>Taiwan</wicri:noRegion>
</affiliation>
</author>
<author>
<name sortKey="Lee, Ching En" sort="Lee, Ching En" uniqKey="Lee C" first="Ching-En" last="Lee">Ching-En Lee</name>
<affiliation wicri:level="1">
<country xml:lang="fr" wicri:curation="lc">République populaire de Chine</country>
<wicri:regionArea>Department of Industrial Engineering and Management, National Chiao Tung University, Hsin Chu, Taiwan</wicri:regionArea>
<wicri:noRegion>Taiwan</wicri:noRegion>
</affiliation>
</author>
</analytic>
<monogr></monogr>
<series>
<title level="j">European Journal of Operational Research</title>
<title level="j" type="abbrev">EOR</title>
<idno type="ISSN">0377-2217</idno>
<imprint>
<publisher>ELSEVIER</publisher>
<date type="published" when="1999">1999</date>
<biblScope unit="volume">131</biblScope>
<biblScope unit="issue">1</biblScope>
<biblScope unit="page" from="78">78</biblScope>
<biblScope unit="page" to="94">94</biblScope>
</imprint>
<idno type="ISSN">0377-2217</idno>
</series>
<idno type="istex">D7B62F29398F2D82880ADE4875EFC1203BBF41BF</idno>
<idno type="DOI">10.1016/S0377-2217(99)00446-4</idno>
<idno type="PII">S0377-2217(99)00446-4</idno>
</biblStruct>
</sourceDesc>
<seriesStmt>
<idno type="ISSN">0377-2217</idno>
</seriesStmt>
</fileDesc>
<profileDesc>
<textClass></textClass>
<langUsage>
<language ident="en">en</language>
</langUsage>
</profileDesc>
</teiHeader>
<front>
<div type="abstract" xml:lang="en">The standard work-in-process (WIP) level in a wafer fabrication factory is an important parameter which can be properly used to trigger the decision of when to release specific wafer lots. There are many WIP-based release control policies which have been proven to be effective for wafer fabrication manufacturing, few methods have been proposed to find the suitable WIP-level as a parameter for these release policies. This paper proposes a queueing network-based algorithm to determine the total standard WIP level so that the Fixed-WIP release algorithm to determine the total standard WIP level so that the Fixed-WIP release control policy can apply. A numerical example is provided to elaborate the algorithm. A simulation model of a real-world wafer fabrication factory in Taiwan is built and analyzed. Results of simulation experiment indicate that under the Fixed-WIP control policy, the total standard WIP level estimated from this study achieves a target throughput rate while keeping the corresponding cycle time relatively low. Results also demonstrate that the queueing network-based algorithm is a very useful method to determine the standard WIP level efficiently.</div>
</front>
</TEI>
<affiliations>
<list>
<country>
<li>Niger</li>
<li>République populaire de Chine</li>
</country>
</list>
<tree>
<country name="Niger">
<noRegion>
<name sortKey="Lin, Yu Hsin" sort="Lin, Yu Hsin" uniqKey="Lin Y" first="Yu-Hsin" last="Lin">Yu-Hsin Lin</name>
</noRegion>
</country>
<country name="République populaire de Chine">
<noRegion>
<name sortKey="Lin, Yu Hsin" sort="Lin, Yu Hsin" uniqKey="Lin Y" first="Yu-Hsin" last="Lin">Yu-Hsin Lin</name>
</noRegion>
<name sortKey="Lee, Ching En" sort="Lee, Ching En" uniqKey="Lee C" first="Ching-En" last="Lee">Ching-En Lee</name>
</country>
</tree>
</affiliations>
</record>

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